Uv-Visible Spectrophotometer

Evolution 201 UV-Visible Spectrophotometer

Evolution 220 UV-Visible Spectrophotometer

Optical Design

Double-beam with sample and

reference cuvette positions;

Czerny-Turner Monochromator

Double-beam with sample and

reference cuvette positions;

Application Focused Beam Geometry;

Czerny-Turner Monochromator

Spectral Bandwidth(s)

1.0 nm

Variable: 1 nm; 2 nm;

AFBG Microcell optimized;

AFBG Fiber optic optimized;

AFBG Materials optimized

Light Source

Xenon flash lamp, 3-year warranty (5 years typical lifetime)

Detector

Dual Silicon Photodiodes

Scan Ordinate Modes

Absorbance, % Transmittance, % Reflectance, Kubelka-Munk,

log (1/R), log (Abs), Abs*Factor, Intensity

Resolution

>1.6 (peak-to-valley ratio; toluene in hexane)

Wavelength

Range

190-1100 nm

Accuracy

+0.8 nm (full range 190 to 1100 nm)  ±0.5 nm (546.11 nm mercury line)

Repeatability

0.1 nm (546.11 nm mercury line, SD of 10 measurements)

Scanning Speed

<1 to 6000 nm/min; variable

Data Intervals

10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm

Photometric

Range

>3.5 A

Display Range

-0.3 to 4.0 A

Accuracy Instrument

0.5 A: ±0.004 A     1A: ±0.006 A       2A: ±0.010 A

Measured at 440 nm using neutral density filters traceable to NIST/NPL

Accuracy Sealed Solutions (EP/BP/TGA)

+0.010 A (60 mg/L K 2 Cr2O7)

Noise

0A: 0.00015 A   1A:0.00050 A     2A: 0.00080 A      260 nm, 1.0 nm SBW, RMS

Drift (Stability)

<0.0005 A/hr       500 nm, 1.0 nm SBW, 1 hour warm-up

Stray Light

KCl, 198 nm:  T      NaI, 220 nm: 0.05% T      NaNO2    340 nm: <0.05% T

Baseline Flatness

+0.0010 A       200-800 nm, 1.0 nm SBW, smoothing

Keypad

Sealed Membrane

Local Control Option Display

Touchscreen LCD panel; 800,  480; 17.8 cm (7 in) diagonal

Operating System

Microsoft Windows XP embedded

Dimensions

62.2 cm L x 48.6 cm W x 27.9 cm H (24" L x 19" W x 11" H)

Weight

14.4 kg (32 lb)

Electrical Supply

100-240 V, 50-60 Hz, selected automatically      150 W maximum