THERMO SCIENTIFIC K-ALPHA X-RAY PHOTOELECTRON SPECTROMETER (XPS)

5000 INR

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Product Details:

Feature Rapid sample throughput; high sensitivity; advanced data processing; monochromatic X-ray source; charge compensation; multi-point analysis.
Automation Grade Fully automated sample introduction and analysis routines.
Temperature Range 15C to 35C operational
Model No K-Alpha
Frequency 50/60 Hz
Power Source AC mains power supply
Voltage 230 V AC
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THERMO SCIENTIFIC K-ALPHA X-RAY PHOTOELECTRON SPECTROMETER (XPS) Price And Quantity

Minimum Order Quantity 1 Piece
Price 5000 INR

THERMO SCIENTIFIC K-ALPHA X-RAY PHOTOELECTRON SPECTROMETER (XPS) Product Specifications

Accuracy Chemical shift resolution <0.5 eV; spatial resolution <30 m
Type Fully integrated X-Ray Photoelectron Spectrometer (XPS) for surface analysis.
Capacity Designed for small to medium-sized sample analysis; accommodates up to 4 samples per vacuum cycle.
Equipment Materials Stainless steel vacuum chamber; analytical-grade materials in detector and electronics.
Core Components Monochromated Al K X-ray source, electron energy analyzer, multi-channel detector, vacuum system.
Measurement Range 0-1350 eV (Binding Energy Range)
Weight Approx. 400 kg
Voltage 230 V AC
Dimension (L*W*H) Approx. 150 cm x 110 cm x 132 cm
Usage Surface chemical analysis of solids, thin films, powders, and coatings; academic and industrial research.
Power Source AC mains power supply
Model No K-Alpha
Temperature Range 15C to 35C operational
Frequency 50/60 Hz
Automation Grade Fully automated sample introduction and analysis routines.
Feature Rapid sample throughput; high sensitivity; advanced data processing; monochromatic X-ray source; charge compensation; multi-point analysis.
Display Type High-resolution, integrated touchscreen interface and PC control.

THERMO SCIENTIFIC K-ALPHA X-RAY PHOTOELECTRON SPECTROMETER (XPS) Trade Information

Supply Ability 5-10 Piece piece Per Month
Delivery Time 6-8 Week

Product Description

Achieve research-grade results with the minimum effort. The Thermo Scientific K-Alpha⁺ X-ray Photoelectron Spectrometer (XPS) System is a fully integrated, monochromated small-spot XPS system with depth profiling capabilities. State-of-the-art performance, reduced cost of ownership, increased ease of use and compact size make the K-Alpha X-ray XPS System ideal for a multi-user environment.

Description

Designed for Productivity, from Research to Routine

Building on the legacy of the award-winning K-Alpha XPS System, the K-Alpha+ spectrometer delivers much improved spectroscopic performance. This leap forward results in faster analysis times, improved element detection, and the possibility to acquire data at higher resolution yielding better chemical state identification.

Analytical options include the revolutionary dual mode ion source, a vacuum transfer module for moving air-sensitive samples from a glove box to the system, and the tilt module for ARXPS data collection. Equipped with the Thermo Scientific Avantage Data System, the complete surface analysis software system, the K-Alpha+ has a range of software features designed to optimize data interpretation, data

Monochromatic X-Ray Source for Precise Surface Analysis

Equipped with a monochromated Al K X-ray source adjustable up to 72 W, the K-Alpha XPS excels in detecting subtle surface chemical characteristics. This design minimizes background noise, enhances spectral clarity, and ensures accurate elemental identification in a diverse range of samples.

Advanced Vacuum System for Ultra-Low Contamination

The combined turbo molecular and rotary pump vacuum system achieves base pressures below 7x10^-9 mbar, ensuring clean analytical environments. High-purity results are guaranteed, even for sensitive applications requiring stringent contamination control.

Fully Automated Sample Handling and Throughput

With an automated carousel able to load multiple samples per cycle, the K-Alpha streamlines workflow and maximizes analysis productivity. The systems automation reduces operator intervention, speeding up processes and enabling repeatable, reliable measurements for small to medium sample sets.

FAQs of THERMO SCIENTIFIC K-ALPHA X-RAY PHOTOELECTRON SPECTROMETER (XPS):

Q: How does the K-Alpha XPS achieve high sensitivity in surface chemical analysis?

A: High sensitivity is achieved via a multi-channel plate detector, monochromatic Al K X-ray source, and dual-beam charge compensation. Together, these features enable rapid data acquisition, precise elemental detection, and accurate quantification, even with challenging non-conductive samples.

Q: What types of samples can be analyzed with the Thermo Scientific K-Alpha XPS?

A: The K-Alpha XPS is suitable for surface analysis of solids, thin films, powders, and coatings. Its robust design and sample carousel accommodate small to medium-sized samples, making it versatile for academic research and industrial quality control.

Q: When should depth profiling and angular resolved XPS be used?

A: Depth profiling is used to investigate the elemental composition as a function of sample depth, ideal for layered materials. Angular resolved XPS provides detailed information about surface chemistry orientation, beneficial for advanced material science and thin film characterization.

Q: Where are the data files from K-Alpha XPS exported and in which formats?

A: Data are exported through the Thermo Avantage software, supporting both proprietary and open-source formats such as ASCII and VAMAS. This versatility fosters compatibility with various data analysis platforms and facilitates collaborative research.

Q: What is the benefit of the automated sample loading carousel?

A: The automated carousel enables simultaneous handling of multiple samples, improving throughput and consistency. Reduced manual handling minimizes contamination risks and ensures dependable analysis for laboratories managing frequent sample cycles.

Q: How does the dual-beam charge compensation system work for non-conductive samples?

A: Dual-beam charge compensation uses both electron and ion sources to neutralize surface charging. This process stabilizes measurements and ensures accurate energy readings, which is vital for precise analysis of non-conductive or insulating materials.

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